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+82-2-2066-3890
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Working Day = Mon ~ Fri
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hitssales@highimage.co.kr
HITS Email
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PRODUCT
'Connect HITS'
引领全球半导体/显示设备产业的跨国企业
PRODUCT
VISION INSPECTION SYSTEM
AUTOMATION SYSTEM
Auto Loader / Unloader
Substrate Split & Merge
Assembly Tester
Protective Band Taping
VISION INSPECTION SYSTEM
Human Error Auto Detection
IR Crack
W/B, D/A
Package Inspection
Mold
LED External Appearance
Panel Film Defect
Damaged Pixel
Glass Surface
LCD Panel
Secondary Cell Battery
PACKING / DISTRIBUTION SYSTEM
Inline Tray Auto Packing
Inline Reel Auto Packing
IR Crack
IR Crack Inspection System
System that inspects a crack, chipping, etc. on pattern side of Flip chip and provides mapping on detected NG
by NIR/SWIR camera
Applicable to 74, 95mm FCBGA Substrate, FCCSP, FCSiP
Customized by Substrate, JIG, Boat
Customized by NIR or SWIR camera
Application of Deep Learning Algorithm to reduce overkill
Mapping & Review Function for verification on detected NG
Composition : M/Z Loading, Barcode Scan, Guide Rail, Transfer,
Vacuum Table, Vision Inspection, M/Z Unloading
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